Navigation and service

 

Sample preparation and pre-characterisation is a prerequisite when undertaking fundamental research on electronic and magnetic properties in polycrystalline materials, thin films and single crystals.

X-Ray facilities

In-house X-Ray facilities

GALAXI AgBeh_jpg

GALAXI - High resolution diffractometer for GISAXS

Poly-crystalline

Poly-crystalline and single crystal sample preparation

Thin film preparation

Thin film preparation

MPMS.png

MPMS, PPMS, CCMS

MFM image

AFM instrument