Instrumentation
The ER-C is one of the word-wide leading institutes for high-resolution electron microscopy and has a long-standing tradition in the development of methods for high-resolution electron microscopy. Under the former direction of Professor Knut W. Urban, aberration correction for electron optics was co-developed here in the 1990s and the very first prototype of an aberration-corrected TEM was installed.
Today, ER-C scientists are active in various research fields:
- Method development in advanced analytical and high-resolution electron microscopy and the future development of sub-ångström and sub-electronvolt microscopy.
- Materials science and high-resolution characterisation in various areas such as electroceramics, oxide superconductors, spintronic materials, semiconductors, complex metallic alloys and catalysts.
- The Structural Biology department (ER-C-3) uses cryo-electron microscopy as the central method to investigate the structural biology of fundamental cellular processes.
The ER-C currently operates six aberration-corrected high-resolution (scanning-) transmission electron microscopes and a large number of additional electron microscopes. Additional equipment for microstructural characterization, advanced in-situ experiments and sample preparation is also available. Find out more on this website.
| Aberration corrected transmission electron microscopes |
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 Copyright: FEI Company Inc.
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The FEI Titan G2 80-200 ChemiSTEM is a probe-corrected analytic STEM equipped with a quadrant segmented detector, a Super-X EDS and a Dual EELS system.
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 Copyright: FZ Jülich, ER-C
| The FEI Titan G2 60-300 HOLO is an image-corrected TEM equipped with a wide pole piece gap, cryo-blades, a direct electron detector, as well as two to three electron biprisms. It is designed for in situ TEM, magnetic imaging and biological imaging studies.
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 Copyright: FZ Jülich, ER-C
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The FEI Titan 50-300 PICO is a double spherical aberration corrected and chromatic aberration corrected (S)TEM alongside with a monochromator, two electron biprisms and a direct electron detector after a post column energy filter. It allows a spatial resolution below 50 pm in both TEM and STEM modes.
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 Copyright: FZ Jülich, ER-C
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The FEI Titan 80-300 STEM is a probe-corrected STEM equipped with a monochromator and a post column energy filter system.
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 Copyright: FZ Jülich, ER-C
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The FEI Titan 80-300 TEM is an image-corrected TEM designed for high resolution TEM imaging studies.
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 Copyright: FZ Jülich, ER-C
| The Hitachi HF5000 is a probe-corrected environmental STEM equipped with cold field emission gun, pixelated detectors, a dual EDS detector and a post column energy filter. |
| Transmission electron microscopes |
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 Copyright: FEI Company Inc.
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The Tecnai G2 F20 is a versatile (S)TEM optimized for imaging at medium resolution in both TEM and STEM modes as well as for performing chemical analysis using either EDS or EELS.
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 Copyright: FZ Jülich, ER-C
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Zeiss Libra 120 TEM
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| Instruments for biological samples |
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 Copyright: FZ Jülich, ER-C
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The TFS Talos 120C transmission electron microscope is a screening microscope suitable for negative staining and cryo samples.
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 Copyright: FZ Jülich, ER-C
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The TFS Talos Arctica is a 200 kV field emission gun transmission cryo electron microscope designed for high resolution structure determination. It is equipped with a Gatan Bioquantum K3 direct electron detector with an energy filter.
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 Copyright: FZ Jülich, ER-C
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The TFS Vitrobot Mark IV plunge freezer is used for cryo sample preparation. Samples are automatically blotted and rapidly frozen in liquid ethane to embed biological samples in vitreous ice.
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| Scanning electron microscopes |
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 Copyright: JEOL Ltd.
| The JEOL 7400F is a scanning electron microscope equipped with a cold field emission gun and primarily to be used for analysis where ultra high resolution is required.
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 Copyright: FZ Jülich, ER-C
| The JEOL 840A is a medium resolution scanning electron microscope used for conventional microstructure analyses.
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| Focused ion beam instruments |
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 Copyright: FEI Company Inc.
| The FEI Helios NanoLab 400S is a focused ion beam (FIB) system to be operated in dual beam mode.
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Copyright: FZ Jülich, ER-C
| The FEI Helios NanoLab 460F1 is a highly advanced dual beam FIB-SEM platform for imaging and analytical measurements, transmission electron microscopy (TEM) sample and atom probe (AP) needle preparation, process development and process control.
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