Navigation und Service


Focused ion beams

Instruments

Description

The FEI Helios NanoLab 400S is a focused ion beam (FIB) system to be operated in dual beam mode.


More@er-c.org

The FEI Helios NanoLab 460F1 is a highly advanced dual beam FIB-SEM platform for imaging and analytical measurements, transmission electron microscopy (TEM) sample and atom probe (AP) needle preparation, process development and process control.

More@er-c.org


Servicemenü

Homepage