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Aberration corrected electron microscopes

Instruments

Description

The FEI Titan G2 80-200 CREWLEY is a remotely operated field emission gun (scanning) transmission electron microscope equipped with a high-brightness Schottky field emission electron gun


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The FEI Titan G2 60-300 HOLO is a field emission gun transmission electron microscope designed for electron holography and in situ TEM analyses.


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The FEI Titan 50-300 PICO is a unique fourth generation field emission gun transmission electron microscope equipped with a high-brightness electron gun, a monochromator unit, and a Cs probe corrector.


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The FEI Titan 80-300 STEM is a field emission gun scanning transmission electron microscope equipped with a probe spherical aberration corrector element along with an electron monochromator and a post column energy filter system.

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The FEI Titan 80-300 TEM is a field emission gun transmission electron microscope equipped with an imaging spherical aberration corrector element.


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